NANOVEA
6 Morgan Ste 156
Irvine CA California
United States 92618
Irvine CA California
United States 92618
Phone:
9494619292
Fax:
9494619232
Email:
info@nanovea.com
Tags:
surface measurement
Keywords:
profilometer, profilometry
Nanovea Profilometers are designed with leading edge Chromatic Confocal optical technology (axial chromatism) both ISO and ASTM compliant. The technique measures a physical wavelength directly related to a specific height without using any complex algorithms. This ensures accurate results for all surface conditions. There is no influence from sample's reflectivity, no need for frequent calibrations and no effects due to changes in measurement parameters. Utilizing a raster scan, the Profilometer can measure in 2D and 3D, allowing a flexible measurement solution for all applications. The platforms can be integrated with a video microscope which extends the profilometers capabilities into the realm of surface microscopy or automation. Several automation options are available including: programmable recipes, pattern recognition, machine vision, automatic pass/fail results and database communication. Many standard Profilometer models are available including a first fully portable Profilometer, the Jr-25. Profilometers can also be custom built with various platform sizes, motorization configuration (rotational, high speed and Class 1 Clean Room). The Profilometers durability and low cost of use are ideal for quality control environments.
